• DocumentCode
    2649211
  • Title

    Reliability of Mutil-Layer ceramic capacitor and its conduction mechanism under high electric field

  • Author

    Lu, Yudong ; En, Yunfei ; Wan, Ming ; Wang, Xin

  • Author_Institution
    Applic. of Electron. Component Lab., China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China
  • fYear
    2011
  • fDate
    17-19 June 2011
  • Firstpage
    501
  • Lastpage
    504
  • Abstract
    The temperature-dependent DC conduction mechanism in BaTiO3-based multilayer ceramic capacitors has been discussed in this paper. In the high electric field, BaTiO3-based Multi-Layer Ceramic Capacitor (MLCC) showed different DC conduction mechanism in room-temperature, Curie-temperature, and high-temperature regions. The DC conduction mechanisms at room and high temperature are Schottky effect and ionic flow, respectively. However, the mechanism at Curie temperature showed a tunnel-like current, abnormal temperature-independence DC conduction current. For the study of this abnormal phenomenon, the structural nature of insulting solids of practical importance is emphasized. Based on the relation of barrier height and phase transformation, the Curie-temperature region is actually controlled by Schottky process. The DC conduction mechanism of BaTiO3-based MLCC in Curie-temperature region can compatibly explained by the change of barrier height resulting from phase transformation.
  • Keywords
    Schottky barriers; barium compounds; ceramic capacitors; ionic conductivity; reliability; solid-state phase transformations; BaTiO3; Curie temperature; Schottky effect; barrier height; ionic flow; multilayer ceramic capacitor; phase transformation; reliability; temperature 293 K to 298 K; temperature-dependent DC conduction current; tunnel-like current; Capacitors; Ceramics; Crystals; Electrodes; Temperature; Tunneling; multi-layer ceramic capacitor; phase transformation; schottky effect; tunneling effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4577-1229-6
  • Type

    conf

  • DOI
    10.1109/ICQR2MSE.2011.5976662
  • Filename
    5976662