Title :
Analog test design with IDD measurements for the detection of parametric and catastrophic faults
Author :
Lindermeir, Walter M. ; Vogels, Thomas J. ; Graeb, Helmut E.
Author_Institution :
Inst. of Electron. Design Autom., Tech. Univ. of Munich, Germany
Abstract :
Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness
Keywords :
analogue integrated circuits; automatic testing; electric current measurement; fault diagnosis; integrated circuit testing; quantisation (signal); ADC quantization noise; IDD measurements; IC testing; analog test design; catastrophic faults; high-quality analog testing; parametric faults; Circuit faults; Circuit testing; Current measurement; Current supplies; Fault detection; Integrated circuit measurements; Integrated circuit testing; Manufacturing processes; Noise measurement; Power supplies;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655953
