Scan design and DFT practices

Summary form only given. This tutorial discusses the most important and practical DFT technique in industry - scan in detail: scan cells, scan chains, scan I/O, scan architectures, scan protocols, scan rules, scan timing, scan power, scan debug; overview of JTAG and BIST. It also covers at-speed scan testing and statistical timing scan testing as well as recent advances in DFT including IJTAG and IEEE P1149.7.