DocumentCode :
2649730
Title :
Effects of random geometric perturbations on slow wave devices
Author :
Pengvanich, P. ; Lau, Y.Y. ; Chernin, D. ; Luginsland, J.W. ; Gilgenbach, R.M.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
309
Lastpage :
309
Abstract :
Summary form only given. Motivated by the current interest in THz source, where miniature circuits are usually required, we evaluate the effects of geometrical random errors introduced during the manufacturing processes on the circuit characteristics. One such study was given in a previous paper, where a pisection lumped element was used to model a periodic slow wave structure. In this paper, we extend the formulation of D. Dialetis and D. Chernin [IEEE Conference Record (1997)] to other geometries, such as the Smith-Purcell radiator or the traveling wave tube. A continuum model is used. Random perturbations are incorporated in the beam-circuit interaction in such a way that, for the traveling wave tube, the Pierce dispersion relation, together with the launching loss, are recovered for an ideal tube free of manufacturing errors. Our preliminary study shows that the effects on gain and efficiency depend not only on the magnitude of the manufacturing errors, but also on the random samples used to represent the axial distribution of these errors. An analytic theory, together with numerical results, will be presented
Keywords :
dispersion relations; slow wave structures; submillimetre wave generation; Pierce dispersion relation; Smith-Purcell radiator; THz source; beam-circuit interaction; continuum model; periodic slow wave structure; pisection lumped element; random geometric perturbations; traveling wave tube; Manufacturing; Microwave circuits; Microwave devices; Nuclear and plasma sciences; Plasma devices; Plasma materials processing; Plasma properties; Plasma sources; Plasma waves; Pulse circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
Type :
conf
DOI :
10.1109/PLASMA.2006.1707182
Filename :
1707182
Link To Document :
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