Title :
The automatic generation of march tests
Author :
van de Goor, A.J. ; Smit, B.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
Many memory tests have been designed in the past, one class of tests which has been proven to be very efficient in terms of fault coverage as well as test time, is the class of march tests. Designing march tests is a tedious, manual task. This paper presents a method which can, given a set of fault models, automatically generate the required march tests. It has been implemented in the programming language C and shown to be effective
Keywords :
automatic test software; fault diagnosis; finite state machines; integrated circuit testing; integrated memory circuits; random-access storage; C programming language; automatic generation; fault coverage; fault models; march tests; memory tests; Automata; Automatic testing; Decoding; Fault detection; Mathematical model; Performance evaluation; Read-write memory; Writing;
Conference_Titel :
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-6245-X
DOI :
10.1109/MTDT.1994.397192
