• DocumentCode
    2650014
  • Title

    How n2 flow rate changes etching

  • Author

    Helhel, S.

  • Author_Institution
    Fac. of Eng., Electron. & Commun. Eng., Akdeniz Univ., Antalya
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    326
  • Lastpage
    326
  • Abstract
    Summary form only given. A gas flow rate is one of the main parameters affecting the discharge surface treatment. This is the nitrogen plasma coating technology presented, and a power coupling efficiency of microwave source to bulk plasma for thin film coating performance has been tried to figure out. Silicone based polymer substrates were interacted with N2 plasma discharge which causes the cracks on its surface for a certain time of interaction. Both the plasma density and the resulting ion current density are related to the residence time of the gas atoms or molecules which in turn is determined by the pumping speed and the gas flow rate. Scanning electron microscope images of the effects of exposing the polymer composite to nitrogen plasma with different gas flow rate are presented
  • Keywords
    nitrogen; plasma density; plasma materials processing; plasma transport processes; plasma-wall interactions; polymers; scanning electron microscopy; sputter etching; surface cracks; surface structure; N2; discharge surface treatment; etching; gas flow rate; ion current density; microwave source; nitrogen plasma coating technology; plasma density; polymer composite; power coupling efficiency; residence time; scanning electron microscope images; silicone based polymer substrates; surface cracks; thin film coating; Coatings; Etching; Fault location; Fluid flow; Nitrogen; Plasma applications; Plasma density; Plasma sources; Surface cracks; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1707199
  • Filename
    1707199