Title :
A time saving testing scheme for mask ROM based on structure oriented failures
Author :
Wu, Tsung Chih ; Lee, Chung Len
Author_Institution :
United Microelectron. Corp., Hsin-Chu, Taiwan
Abstract :
This paper proposes a time saving testing scheme for mask ROM. The scheme generates and applies test patterns based on a structure oriented failure mode to test ROM. An 8 mega-bit ROM is used as a vehicle to demonstrate this scheme and the results show that an increase of testing time speed can be achieved if the yield of the memory is low (<50%)
Keywords :
fault diagnosis; integrated circuit testing; integrated memory circuits; read-only storage; 8 Mbit; mask ROM; structure oriented failures; test patterns; testing scheme; time savings; yield; Boron; Failure analysis; Implants; Microelectronics; Read only memory; Scanning electron microscopy; Technological innovation; Test pattern generators; Testing; Vehicles;
Conference_Titel :
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-6245-X
DOI :
10.1109/MTDT.1994.397194
