DocumentCode
2650036
Title
A time saving testing scheme for mask ROM based on structure oriented failures
Author
Wu, Tsung Chih ; Lee, Chung Len
Author_Institution
United Microelectron. Corp., Hsin-Chu, Taiwan
fYear
1994
fDate
8-9 Aug 1994
Firstpage
72
Lastpage
77
Abstract
This paper proposes a time saving testing scheme for mask ROM. The scheme generates and applies test patterns based on a structure oriented failure mode to test ROM. An 8 mega-bit ROM is used as a vehicle to demonstrate this scheme and the results show that an increase of testing time speed can be achieved if the yield of the memory is low (<50%)
Keywords
fault diagnosis; integrated circuit testing; integrated memory circuits; read-only storage; 8 Mbit; mask ROM; structure oriented failures; test patterns; testing scheme; time savings; yield; Boron; Failure analysis; Implants; Microelectronics; Read only memory; Scanning electron microscopy; Technological innovation; Test pattern generators; Testing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location
San Jose, CA
Print_ISBN
0-8186-6245-X
Type
conf
DOI
10.1109/MTDT.1994.397194
Filename
397194
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