• DocumentCode
    2650127
  • Title

    3-dimensional simulations of breakdown using the vorpal software tool

  • Author

    Smithe, David ; Stoltz, Peter ; Carlsson, Johan ; Messmer, Peter ; Nieter, Chet ; Busby, Richard ; Cary, John R. ; Dolgashev, Valery

  • Author_Institution
    Tech-X Corp., Boulder, CO
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    332
  • Lastpage
    332
  • Abstract
    Summary form only given. We show simulations of RF breakdown phenomenon in waveguides and at waveguide-plasma interfaces. High gradient induced breakdown in waveguides is studied with self-consistent field emission, ionization cascade, and secondary models. We will test DSMC (discrete simulation Monte Carlo) particle-based algorithms for use in dynamic modeling of neutral gas in breakdown events. We investigate different initial conditions and breakdown initiation scenarios, to test their ability to generate breakdown plasma, and we track the plasma evolution in order to compare behavior to laboratory observations. Breakdown at the interface between dielectric-loaded waveguides and edge plasmas are also investigated. Here we are interested in the effect of power level, waveguide orientation, magnetic field, edge plasma and neutral density, on the breakdown plasma evolution
  • Keywords
    Monte Carlo methods; field emission; high-frequency discharges; ionisation; plasma boundary layers; plasma density; plasma filled waveguides; plasma simulation; 3-dimensional simulations; RF breakdown; VORPAL software tool; dielectric-loaded waveguides; discrete simulation Monte Carlo; edge plasmas; field emission; ionization cascade; neutral density; particle-based algorithms; waveguide-plasma interfaces; Discrete event simulation; Electric breakdown; Ionization; Monte Carlo methods; Plasma density; Plasma simulation; Plasma waves; Radio frequency; Software tools; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1707205
  • Filename
    1707205