DocumentCode :
265017
Title :
Interval dependent wavelet de-noising technique for high frequency transient signals analysis during impulse testing of transformers
Author :
Velandy, Jeyabalan ; Surendran, Jayalakshmi
Author_Institution :
Global R&D centre, Crompton Greaves Ltd., Mumbai, India
fYear :
2014
fDate :
15-17 Dec. 2014
Firstpage :
1
Lastpage :
4
Abstract :
In transient phenomena of transformer, one of the important research areas of interest is removing the noise in the measured signals during impulse test and to find if there exists a relation between the high frequency transient signals to declare about pass criterion or fail criterion of the transformer at manufacturing location. In this paper, to remove noise and achieve better SNR, interval dependent wavelet de-noising technique is utilized against multivariate de-noising technique. After proper selection of de-noising technique to identify the winding fault in transformer, nonlinear interpretation technique is employed. To prove the usefulness of the proposed technique, impulse testing data of 66.7 MVA and 250 MVA transformers are used.
Keywords :
electrical faults; impulse testing; power transformer testing; signal denoising; transformer windings; transient analysis; SNR; apparent power 250 MVA; apparent power 66.7 MVA; high frequency transient signals analysis; interval dependent denoising technique; interval dependent wavelet denoising technique; manufacturing location; multivariate denoising technique; nonlinear interpretation technique; transformer impulse testing; winding fault; Noise reduction; Power transformer insulation; Signal to noise ratio; Transient analysis; Wavelet transforms; Windings; Denoising techniques; Impulse test; SNR; Signal processing; Transformers; Wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial and Information Systems (ICIIS), 2014 9th International Conference on
Conference_Location :
Gwalior
Print_ISBN :
978-1-4799-6499-4
Type :
conf
DOI :
10.1109/ICIINFS.2014.7036605
Filename :
7036605
Link To Document :
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