DocumentCode
2650233
Title
Improved confidence limits of T2 statistic for monitoring batch processes
Author
Jiang, Liying ; Xu, Baojian ; Xi, Jianhui ; Cui, Jianguo ; Fu, Li
Author_Institution
Sch. of Autom., Shenyang Aerosp. Univ., Shenyang, China
fYear
2012
fDate
23-25 May 2012
Firstpage
2928
Lastpage
2932
Abstract
Multiway principal component analysis (MPCA) is an effective method for batch processes monitoring and fault detection, but it is shown that the low sensitive of T2 statistic and the high confidence limits of T2 statistic commonly appeared in practical monitoring. In order to overcome these shortcomings, an improved method of determining the T2 confidence limits is proposed. The T2 values of normal history data are organized as a new sample dataset after building MPCA model. By applying PCA to this dataset, the confidence limits of T2 statistic will be attained. The simulation results of penicillin fermentation process platform show that the proposed method is able to detect faults more prompt and accurate than traditional method.
Keywords
batch processing (industrial); drugs; fault diagnosis; fermentation; principal component analysis; process monitoring; statistical distributions; MPCA model; T-squared statistics; batch process monitoring; confidence limit improvement; fault detection; multiway principal component analysis; penicillin fermentation process; Arrays; Batch production systems; Buildings; Data models; Monitoring; Principal component analysis; Substrates; Batch process; PCA; Process monitoring; T2 statistic;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Decision Conference (CCDC), 2012 24th Chinese
Conference_Location
Taiyuan
Print_ISBN
978-1-4577-2073-4
Type
conf
DOI
10.1109/CCDC.2012.6243070
Filename
6243070
Link To Document