Title :
An optimized ΔΣ fractional-N frequency synthesizer for CMOS UHF RFID reader
Author :
Shi, Chunqi ; Zhang, Runxi ; Lai, Zongsheng
Author_Institution :
Inst. of Microelectron. Circuits & Syst., East China Normal Univ. Shanghai, Shanghai, China
Abstract :
A novel 3-bit 3rd-order ΔΣ fractional-N frequency synthesizer specialized for monolithic UHF band radio frequency identification reader is implemented in 0.18 μm CMOS technology. The phase noise requirements are recapitulated for the zero-IF transceiver architecture and EPC global C1G2 and ETSI multi-protocol operation. The measurement results show that the synthesizer phase noise at 200 kHz offset is suppressed by the additional zero configuration in delta-sigma modulator (DSM)´s noise transfer function with acceptable in-band noise penalty. The measured phase noise is -102 and -126.5dBc/Hz at 200 kHz and 1 MHz offsets from 900 MHz operation frequency while drawing 9.6 mA from 1.8 V power supply.
Keywords :
CMOS integrated circuits; UHF integrated circuits; delta-sigma modulation; frequency synthesizers; phase noise; radiofrequency identification; transceivers; transfer functions; 3-bit 3rd-order ΔΣ fractional-N frequency synthesizer; CMOS UHF RFID reader; EPC global C1G2 multi-protocol operation; ETSI multi-protocol operation; current 9.6 mA; delta-sigma modulator; frequency 900 MHz; in-band noise penalty; monolithic UHF band radio frequency identification reader; noise transfer function; phase noise; size 0.18 μm; voltage 1.8 V; zero configuration; zero-IF transceiver architecture; CMOS technology; Frequency synthesizers; Noise measurement; Phase measurement; Phase modulation; Phase noise; Radiofrequency identification; Telecommunication standards; Transceivers; UHF measurements; CMOS; delta-sigma(ΔΣ); fractional-N synthesizer; ultra-high-frequency radio-frequency identification (UHF RFID);
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
DOI :
10.1109/ASICON.2009.5351343
