Title :
A unified test and debug platform for SOC design
Author :
Lee, Kuch Jong ; Chang, Chin Yao ; Su, Alan ; Liang, Si Yuan
Author_Institution :
Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
As the complexity of System-on-a-Chip (SOC) design keeps growing rapidly, efficient and economic testing and debugging for complex circuits at silicon stage has become extremely important. In this paper we present a unified platform that facilitates efficient on-chip testing and silicon debugging in a PC-based environment. Test techniques including scan and BIST, and debug functions including online tracing, hardware breakpoint insertion and cycle-based single-stepping, are supported in this platform. An automatic design tool is also developed to simplify the generation and application of the platform. With this platform users can easily carry out structural testing with the scan or BIST test mode, functional verification with the on-line tracing mode, and fault diagnosis with the single-step mode.
Keywords :
built-in self test; computer debugging; embedded systems; integrated circuit design; integrated circuit testing; microcomputers; system buses; system-on-chip; BIST; SOC design; automatic design tool; cycle-based single-stepping; debug functions; embedded processor; fault diagnosis; hardware breakpoint insertion; memory bus; on-chip testing; online tracing; scan test; silicon debugging; structural testing; system bus; system-on-a-chip design; unified platform; Automatic testing; Centralized control; Circuit testing; Communication system control; Debugging; Environmental economics; Hardware; Silicon; System testing; System-on-a-chip; SOC testing; debug platform; silicon debug;
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
DOI :
10.1109/ASICON.2009.5351351
