DocumentCode :
2650660
Title :
Managing Uncertainty in Text-to-Sketch Tracking Problems
Author :
Schmill, Matthew D. ; Oates, Tim
Author_Institution :
Comput. Sci. & Electr. Eng. Dept., Univ. of Maryland Baltimore County, Baltimore, MD, USA
fYear :
2011
fDate :
7-9 Nov. 2011
Firstpage :
430
Lastpage :
437
Abstract :
Text-to-Sketch (T2S) is a class of problems in which geolocation is performed using natural language descriptions of a location or locations as input. This is a challenging problem due to the many sources of uncertainty inherent to the task: there is often syntactic and semantic ambiguity present in the input observations, as well as referential ambiguity when the language used to describe the scene may refer to many possible objects or locations in the world. Tracking problems, in which the Text-to-Sketch paradigm is extended to incorporate multiple locations and movements over a temporal dimension, introduce additional uncertainty. We describe a tool for managing the uncertainty in Text-to-Sketch problems called MUTTS. The MUTTS system combines traditional natural language processing (NLP) tools with algorithms used to manage uncertainty in mobile robot navigation to allow the temporal and geographical constraints in the text to incrementally reduce the overall uncertainty of a subject´s location and produce high quality sketches of the subject´s location and movements over time.
Keywords :
mobile robots; natural language processing; path planning; MUTTS system; geographical constraints; mobile robot navigation; natural language descriptions; natural language processing tools; semantic ambiguity; syntactic ambiguity; temporal constraints; temporal dimension; text-to-sketch tracking problems; uncertainty management; Google; Roads; Robot sensing systems; Semantics; Tunneling magnetoresistance; Uncertainty; interactive systems; natural language processing; particle filters; text to sketch; uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Tools with Artificial Intelligence (ICTAI), 2011 23rd IEEE International Conference on
Conference_Location :
Boca Raton, FL
ISSN :
1082-3409
Print_ISBN :
978-1-4577-2068-0
Electronic_ISBN :
1082-3409
Type :
conf
DOI :
10.1109/ICTAI.2011.70
Filename :
6103360
Link To Document :
بازگشت