DocumentCode :
2650749
Title :
Probability of calculation failures by soft errors in an embedded processor core
Author :
Kanbara, Hiroyuki ; Okuhata, Hiroyuki ; Ise, Masanao ; Kinjo, Ryota ; Toda, Yuki
Author_Institution :
ASTEM RI, Kyoto, Japan
fYear :
2009
fDate :
20-23 Oct. 2009
Firstpage :
601
Lastpage :
604
Abstract :
We are developing a 32-bit embedded processor core with soft error detection and recovery mechanisms. Adding a parity bit into pipeline registers makes it possible to detect single event upset in an processor core. Detection of 2-bit and less multiple bit upset and automatic correction of single event upset can be done with single error correction and double error detection code. These soft-error detection/recovery mechanisms cause cost/performance degradation. In this paper, probability of serious calculation failures occurred by SEU in an MIPS R3000 compatible processor core is evaluated. We investigate the probability using register transfer level simulation. The result shows that impacts of SEU to calculation result differ much, when SEU happens in a program counter, an instruction register or register files. Soft error detection/recovery mechanism of an embedded processor core can be selected automatically when permitted soft error rate of an application program is given as a specification.
Keywords :
error detection codes; microprocessor chips; probability; 32-bit embedded processor core; MIPS R3000 compatible processor core; calculation failure probability; double error detection code; instruction register; program counter; recovery mechanisms; register files; register transfer level simulation; single error correction; single event upset detection; soft error detection; soft errors; Costs; Counting circuits; Degradation; Error analysis; Error correction codes; Event detection; Pipelines; Probability; Registers; Single event upset; Embedded Processor; Error detection; Soft Error;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
Type :
conf
DOI :
10.1109/ASICON.2009.5351357
Filename :
5351357
Link To Document :
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