• DocumentCode
    2650749
  • Title

    Probability of calculation failures by soft errors in an embedded processor core

  • Author

    Kanbara, Hiroyuki ; Okuhata, Hiroyuki ; Ise, Masanao ; Kinjo, Ryota ; Toda, Yuki

  • Author_Institution
    ASTEM RI, Kyoto, Japan
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    601
  • Lastpage
    604
  • Abstract
    We are developing a 32-bit embedded processor core with soft error detection and recovery mechanisms. Adding a parity bit into pipeline registers makes it possible to detect single event upset in an processor core. Detection of 2-bit and less multiple bit upset and automatic correction of single event upset can be done with single error correction and double error detection code. These soft-error detection/recovery mechanisms cause cost/performance degradation. In this paper, probability of serious calculation failures occurred by SEU in an MIPS R3000 compatible processor core is evaluated. We investigate the probability using register transfer level simulation. The result shows that impacts of SEU to calculation result differ much, when SEU happens in a program counter, an instruction register or register files. Soft error detection/recovery mechanism of an embedded processor core can be selected automatically when permitted soft error rate of an application program is given as a specification.
  • Keywords
    error detection codes; microprocessor chips; probability; 32-bit embedded processor core; MIPS R3000 compatible processor core; calculation failure probability; double error detection code; instruction register; program counter; recovery mechanisms; register files; register transfer level simulation; single error correction; single event upset detection; soft error detection; soft errors; Costs; Counting circuits; Degradation; Error analysis; Error correction codes; Event detection; Pipelines; Probability; Registers; Single event upset; Embedded Processor; Error detection; Soft Error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351357
  • Filename
    5351357