Title :
Measuring Anisotropy in Microwave Substrates
Author :
Olyphant, M., Jr.
fDate :
April 30 1979-May 2 1979
Abstract :
A split TE/sub 111/ cavity is described which enables the accurate measurement of the within-plane dielectric constant of a 1 inch disk cut from substrates in the range 25 to 125 mils in thickness. HP 67/97 programs are included for both end and center located specimens.
Keywords :
Anisotropic magnetoresistance; Dielectric constant; Dielectric measurements; Dielectric substrates; Microwave measurements; Resonance; Resonant frequency; Tellurium; Testing; Thickness measurement;
Conference_Titel :
Microwave Symposium Digest, 1979 IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
DOI :
10.1109/MWSYM.1979.1123982
