DocumentCode
2651225
Title
A New Self-Calibrating Transistor Test Fixture
Author
Lane, R.Q. ; McCollum, G.L.
fYear
1979
fDate
April 30 1979-May 2 1979
Firstpage
99
Lastpage
101
Abstract
The design of a test fixture for strip line microwave transistors, accommodating precision coaxial calibration standards, is described. A wide variety of package styles may be measured without disturbing the initial calibration. Test data to 16 GHz is shown.
Keywords
Automatic testing; Calibration; Coaxial components; Conductors; Connectors; Fixtures; Microwave transistors; Packaging; Scattering parameters; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1979 IEEE MTT-S International
Conference_Location
Orlando, FL, USA
Type
conf
DOI
10.1109/MWSYM.1979.1123984
Filename
1123984
Link To Document