Title :
A New Self-Calibrating Transistor Test Fixture
Author :
Lane, R.Q. ; McCollum, G.L.
fDate :
April 30 1979-May 2 1979
Abstract :
The design of a test fixture for strip line microwave transistors, accommodating precision coaxial calibration standards, is described. A wide variety of package styles may be measured without disturbing the initial calibration. Test data to 16 GHz is shown.
Keywords :
Automatic testing; Calibration; Coaxial components; Conductors; Connectors; Fixtures; Microwave transistors; Packaging; Scattering parameters; Strips;
Conference_Titel :
Microwave Symposium Digest, 1979 IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
DOI :
10.1109/MWSYM.1979.1123984
