DocumentCode :
2651465
Title :
Automatic test case generation using multi-protocol test method
Author :
Soo-In Lee ; Park, Yongbum ; Kim, Myungchul ; Youn, Hee Yong ; Ben Lee
Author_Institution :
Sch. of Eng., Inf. & Commun., Taejon Univ., South Korea
fYear :
2000
fDate :
2000
Firstpage :
360
Lastpage :
366
Abstract :
A method for testing multi-protocol implementation under test (IUT) with a single test suite has been proposed in the literature. It tests a multi-protocol IUT in an integrated way compared to the conventional method, where a single-layer test method and a single-layer embedded test method are applied, respectively, to the upper layer protocol and to lower layer protocols. However, it did not consider how to generate the test cases automatically but proposed only an approach for the test method. This paper proposes an algorithm called multi-protocol test method (MPTM) for automatic test case generation based on that approach. With the MPTM, a multi-protocol IUT consisting of two protocol layers is modeled as two finite state machines (FSMs), and the relationships between the their transitions are defined as a set of transition relationships, pre-execution and carried-by. The proposed algorithm is implemented and applied to a simplified TCP/IP and B-ISDN signaling/SSCOP (service specific connection-oriented protocol). The MPTM is able to test the multi-protocol IUT even though the interfaces between the protocol layers are not exposed. It also allows the same test coverage as conventional test methods, but with a much smaller number of test cases and operations
Keywords :
conformance testing; finite state machines; protocols; B-ISDN signaling/SSCOP; FSM; TCP/IP; automatic test case generation; carried-by transition relationship; finite state machines; multi-protocol IUT; multi-protocol implementation under test; multi-protocol test method; pre-execution transition relationship; service specific connection-oriented protocol; single-layer embedded test method; single-layer test method; test suite; Automata; Automatic testing; B-ISDN; Communication system control; Computer aided software engineering; IEC standards; ISO standards; Multiprotocol label switching; Protocols; TCPIP;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Communications and Networks, 2000. Proceedings. Ninth International Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1095-2055
Print_ISBN :
0-7803-6494-5
Type :
conf
DOI :
10.1109/ICCCN.2000.885515
Filename :
885515
Link To Document :
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