DocumentCode
2651527
Title
Simulation study on process conditions for high-speed silicon photodetector and quantum-well structuring for increased number of wavelength discriminations
Author
Cho, Seongjae ; Kim, Hyungjin ; Sun, Min-Chul ; Kamins, Theodore I. ; Park, Byung-Gook ; Harris, James S., Jr.
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2012
fDate
10-11 June 2012
Firstpage
1
Lastpage
2
Abstract
In this work, process conditions and geometric parameters for high-speed p-i-n silicon photodetector are optimized by device simulation. Efforts were made to build up criteria for device fabrication based on silicon epitaxy. For an optimized silicon photodetector, a bandwidth as wide as 80 GHz was obtained at 1 V. Furthermore, a way of increasing wavelength discriminations by introducing silicon-germanium quantum wells for multiple-wavelength signal processing is exploited.
Keywords
elemental semiconductors; photodetectors; quantum wells; silicon; Si; device fabrication; frequency 80 GHz; high-speed p-i-n silicon photodetector; multiple-wavelengzth signal processing; optimized silicon photodetector; quantum well structuring; silicon epitaxy; silicon-germanium quantum well; voltage 1 V; wavelength discrimination; Anodes; Doping; Photodetectors; Photonics; Semiconductor process modeling; Silicon; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Nanoelectronics Workshop (SNW), 2012 IEEE
Conference_Location
Honolulu, HI
ISSN
2161-4636
Print_ISBN
978-1-4673-0996-7
Electronic_ISBN
2161-4636
Type
conf
DOI
10.1109/SNW.2012.6243286
Filename
6243286
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