Title :
Single Ge quantum dot placement along with self-aligned electrodes for effective management of single electron tunneling
Author :
Chen, I.H. ; Chen, K.H. ; Li, P.W.
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chungli, Taiwan
Abstract :
We demonstrate controlled number and placement of the Ge quantum dot (QD) along with tunnel junction engineering through a self-organized approach for effective management of single electron tunneling. In this approach, a single Ge QD (~11 nm) self-aligning with nickel-silicide electrodes is realized by thermally oxidizing a SiGe nanorod bridging a 15-nm-wide nanotrench in close proximity to electrodes via a spacer bi-layer of Si3N4/SiO2. The fabricated Ge QD single electron transistor exhibits clear Coulomb staircase and Coulomb diamond behaviors at T = 120-300 K.
Keywords :
Ge-Si alloys; electrodes; elemental semiconductors; germanium; nanorods; oxidation; semiconductor quantum dots; single electron transistors; tunnelling; Coulomb diamond behaviors; Coulomb staircase; QD single electron transistor; Si; SiGe; effective management; nanorod bridging; nanotrench; nickel-silicide electrodes; proximity; self-aligned electrodes; self-organized approach; single electron tunneling; single quantum dot; size 15 nm; spacer bilayer; temperature 120 K to 300 K; thermal oxidation; tunnel junction engineering; Electrodes; Junctions; Logic gates; Scanning electron microscopy; Silicon germanium; Temperature dependence; Tunneling;
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2012 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4673-0996-7
Electronic_ISBN :
2161-4636
DOI :
10.1109/SNW.2012.6243292