DocumentCode
2651884
Title
A Novel Feature Selection for Intrusion Detection in Virtual Machine Environments
Author
Alshawabkeh, Malak ; Aslam, Javed A. ; Kaeli, David ; Dy, Jennifer
Author_Institution
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear
2011
fDate
7-9 Nov. 2011
Firstpage
879
Lastpage
881
Abstract
Intrusion detection systems (IDSs) are continuously evolving, with the goal of improving the security of computer infrastructures. However, one of the most significant challenges in this area is the poor detection rate, due to the presence of excessive features in a data set whose class distributions are imbalanced. Despite the relatively long existence and the promising nature of feature selection methods, most of them fail to account for imbalance class distributions, particularly, for intrusion data, leading to poor predictions for minority class samples. In this paper, we propose a new feature selection algorithm to enhance the accuracy of IDS of virtual server environments. Our algorithm assigns weights to subsets of features according to the maximized area under the ROC curve (AUC) margin it induces during the boosting process over the minority and the majority examples. The best subset of features is then selected by a greedy search strategy. The empirical experiments are carried out on multiple intrusion data sets using different commercial virtual appliances and real malwares.
Keywords
greedy algorithms; search problems; security of data; virtual machines; IDS; ROC curve; computer infrastructure security; feature selection methods; greedy search strategy; intrusion detection systems; novel feature selection; virtual appliances; virtual machine environments; virtual server environments; Accuracy; Bit error rate; Boosting; Databases; Feature extraction; Intrusion detection; Trojan horses; area under the ROC curve; boosting; feature selection; imbalanced data; intrusion detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Tools with Artificial Intelligence (ICTAI), 2011 23rd IEEE International Conference on
Conference_Location
Boca Raton, FL
ISSN
1082-3409
Print_ISBN
978-1-4577-2068-0
Electronic_ISBN
1082-3409
Type
conf
DOI
10.1109/ICTAI.2011.138
Filename
6103429
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