• DocumentCode
    2652054
  • Title

    A power BJT model for circuit simulation

  • Author

    Talwalkar, N. ; Lauritzen, P.O. ; Fatemizadeh, B. ; Perlman, D. ; Ma, Cliff L.

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    23-27 Jun 1996
  • Firstpage
    50
  • Abstract
    The power BJT is modeled using the lumped-charge method using simplified forms of the Poisson´s equation, the continuity equation and the Boltzmann relation. All important one-dimensional effects are included in the model. Only nine parameters are needed to completely specify the model except for junction capacitances and parasitic resistances. This model can be easily extended to make a BJT Darlington model
  • Keywords
    Boltzmann equation; Poisson distribution; circuit analysis computing; power bipolar transistors; semiconductor device models; BJT Darlington model; Boltzmann relation; Poisson´s equation; circuit simulation; continuity equation; junction capacitance; lumped-charge method; one-dimensional effects; parasitic resistance; power BJT model; Analytical models; Circuit simulation; Insulated gate bipolar transistors; MOSFETs; Parameter extraction; Parasitic capacitance; Poisson equations; Radiative recombination; Robustness; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1996. PESC '96 Record., 27th Annual IEEE
  • Conference_Location
    Baveno
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-3500-7
  • Type

    conf

  • DOI
    10.1109/PESC.1996.548558
  • Filename
    548558