• DocumentCode
    2652151
  • Title

    Analysis Of Surface Roughness On Semiconductor Laser Etched Facets

  • Author

    Herrick, Robert W. ; Sabo, Lori G. ; Levy, Joseph L.

  • Author_Institution
    McDonnell Douglas Electronic Systems Company
  • fYear
    1991
  • fDate
    29 Jul-2 Aug 1991
  • Firstpage
    43
  • Lastpage
    44
  • Keywords
    Etching; Fourier transforms; Frequency; Grain size; Mirrors; Rough surfaces; Semiconductor lasers; Size control; Surface emitting lasers; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Epitaxial Materials and In-Situ Processing for Optoelectronic Devices, 1991/Microfabrication for Photonics and Optoelectronics, 1991. LEOS 1991 Summer Topical Meetings on
  • Print_ISBN
    0-87942-618-7
  • Type

    conf

  • DOI
    10.1109/LEOSST.1991.639011
  • Filename
    639011