Title :
Guided weapons test station upgrade-a cooperative effort with Taiwan
Author :
Stanfield, Steve
Author_Institution :
Weapons Div., Naval Air Warfare Center, Point Mugu, CA, USA
Abstract :
The Naval Air Warfare Center-Weapons Division (NAWC-WD) in cooperation with the Taiwan Chang Shun Institute of Science and Technology (CSIST) has undertaken a product improvement project to upgrade the first generation common munitions tester, the Guided Weapons Test Station (GWTS). The GWTS is mostly commercial-off-the-shelf (COTS) equipment. As such it is subject to component obsolescence. The P3 I project replaces obsolete COTS, including the system controller with more supportable items. The project goes Further by replacing Compaq/DEC Alpha UNIX with Windows NT12000. This shift requires an en masse re-host of the GWTS software suits Re-host is a challenging process, not without risk, but will more closely align the GWTS design with industry standards. Resources expended now will be more than offset by future savings. The GWTS project is not being conducted in a vacuum. Navy project leaders ensure that CSIST management is continually aware of technical and schedule status, and CSIST engineers will join the team. Raytheon, who is exploring options for new common munitions ATE, monitors upgrade progress, and they have Invited NAWC-WD participation in trade studies for a future Standard Missile test station. The GWTS upgrade team and Raytheon have mutually benefited from this cooperation
Keywords :
automatic test equipment; automatic test software; government policies; military standards; weapons; COTS; CSIST; Guided weapons test station; NAWC-WD; Naval Air Warfare Center-Weapons Division; Navy project; Raytheon; Standard Missile test station; Taiwan; Windows NT12000; commercial-off-the-shelf equipment; common munitions ATE; Computer industry; Control systems; Electrical equipment industry; Engineering management; Job shop scheduling; Missiles; Project management; Software standards; Testing; Weapons;
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-5868-6
DOI :
10.1109/AUTEST.2000.885574