Title :
A software approach for a common munitions test architecture
Author :
Lieberman, Ira ; Insalaco, Stephen ; Van Oosbreem, A.A.
Author_Institution :
Test Autom. Inc., Valencia, CA, USA
Abstract :
A common munitions test architecture is required to support the testing of sophisticated weapon systems from production in the factory through flight test. The architecture establishes basic building blocks that form the foundation for test systems across the component, intermediate, and munitions levels. It must be modular, adaptable, and configurable to meet the ever-increasing demands of today´s test systems. This architecture must support instrument drivers at the component level to provide multi-port, real-time, asynchronous testing at the munitions level. This software test architecture should support a common test executive engine with intuitive graphical interfaces, access user modifiable test modules, perform full-scale end-to-end testing or segmented testing, provide data-logging services, produce customizable reports, call tests developed in any programming language, and support a full range of developmental debugging tools. In addition, the software architecture should be capable of taking continuous advantage of software reuse through standardization, and in gaining a developmental cost savings and competitive edge. The ability to manage obsolescence must be provided through this software architecture
Keywords :
aerospace testing; automatic testing; military standards; software reusability; weapons; asynchronous testing; common munitions test architecture; common test executive engine; customizable reports; data-logging services; developmental debugging tools; end-to-end testing; flight test; instrument drivers; intuitive graphical interfaces; obsolescence; segmented testing; software reuse; standardization; weapon systems; Computer architecture; Instruments; Production facilities; Production systems; Software architecture; Software debugging; Software performance; Software testing; System testing; Weapons;
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-5868-6
DOI :
10.1109/AUTEST.2000.885576