Title :
Testing for Gaussianity in nonlinear system identification
Author :
Cho, Y.S. ; Oh, W.T. ; Kim, S.B. ; Powers, E.J.
Author_Institution :
Dept. of Electr. & Comput. Eng. Texas Univ., Austin, TX, USA
Abstract :
The Hinich test, which makes use of the statistical properties of the bispectrum, is shown to be an appropriate test in the system identification of a second-order Volterra system. The test for Gaussianity of two important sources which are commonly used for Gaussian inputs in nonlinear system identification-commercial software routines for simulation experiments and noise generators for practical experiments-is shown. The deleterious effects on nonlinear system analysis of assuming a random Gaussian input, when in fact it is non-Gaussian, are demonstrated via an experimental investigation, utilizing higher-order spectra, of the nonlinear behavior of a loudspeaker
Keywords :
identification; loudspeakers; nonlinear systems; Hinich test; bispectrum; commercial software routines for simulation experiments; loudspeaker; loudspeaker testing; noise generators; nonGaussian random inputs effects; nonlinear system identification; random Gaussian input; second-order Volterra system; statistical properties; test for Gaussianity; Gaussian processes; Kernel; Loudspeakers; Noise generators; Nonlinear equations; Nonlinear systems; Signal processing; System identification; System testing; Transfer functions;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.112405