Title :
DTULive: functional digital programming environment
Author :
Meunier, Franklin ; Puzio, G.
Author_Institution :
Integrated Test Solutions, Springfield, MA, USA
Abstract :
As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards
Keywords :
automatic test software; digital circuits; electronic engineering computing; printed circuit testing; programming environments; DTULive; complex circuit cards; digital test programs; functional digital programming environment; nonsimulation test programming environment; test program development; Circuit simulation; Circuit testing; Contracts; Costs; Digital circuits; Hardware; Manufacturing; Programming environments; Programming profession; Reverse engineering;
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-5868-6
DOI :
10.1109/AUTEST.2000.885587
