DocumentCode :
2652838
Title :
Don´t just re-host-improve
Author :
Droste, David B. ; Allman, Robert
Author_Institution :
PEI Electron Inc., Huntsville, AL, USA
fYear :
2000
fDate :
2000
Firstpage :
210
Lastpage :
216
Abstract :
Today´s ATE/TPS business environment is full of ATE upgrade and replacement projects with an associated TPS re-host. One such project is the development of a replacement for the Re-Entry System Test Set for the Minuteman MK12/12A Re-Entry System. The use of new technology provided several opportunities to go beyond a simple replacement and provide a new tester that solved many existing problems at the field operational sites. One benefit was that downsizing using VXI instrument technology allowed the tester to be transportable which in turn allows the development of new shorter cables since the tester can be moved up to the Re-Entry system components. This will alleviate a safety trip hazard at the field sites. The replacement design also simplifies the test set-up for the operator by elimination of junction boxes and external functional interfaces. Additional implemented improvements include the reduction of functional interfaces, improved MTBF, and inclusion of expansion capability for other current and future Air Force equipment. A significant requirement of this project was to maintain existing operational procedures and processes since they were proven and operators were familiar with them. New technology has improved the operator interface and allowed an upgrade to built-in tailored menus, while maintaining the existing test strategies. Other advanced technology features that were incorporated were the implementation of Built in Test, Built-in Self Test and Diagnostic capabilities. Design for Testability has been implemented for improved diagnostic capability for life-cycle maintenance This paper discusses these and other operational benefits that are being provided by this nuclear certifiable replacement tester
Keywords :
automatic test equipment; built-in self test; design for testability; military computing; peripheral interfaces; weapons; ATE replacement; ATE upgrade; ATE/TPS business environment; Built-in Self Test; MTBF; Minuteman MK12/12A; Re-Entry System Test Set; VXI instrument; design for testability; diagnostics; downsizing; expansion capability; external functional interfaces; nuclear certifiable replacement tester; operational benefits; operator interface; safety trip hazard; Automatic testing; Cables; Electronic equipment testing; Fault detection; Instruments; Missiles; Safety; System testing; Vehicles; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1080-7725
Print_ISBN :
0-7803-5868-6
Type :
conf
DOI :
10.1109/AUTEST.2000.885593
Filename :
885593
Link To Document :
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