DocumentCode :
2652858
Title :
Fe doped semi-insulating indium phosphide substrate characterization for device applications
Author :
Grattepain, C. ; Huber, A.M.
Author_Institution :
THOMSON-CSF LCR, France
fYear :
1992
fDate :
21-24 Apr 1992
Firstpage :
195
Lastpage :
199
Keywords :
Chemicals; Crystalline materials; Etching; Indium phosphide; Iron; Optical materials; Optical microscopy; Optical surface waves; Optoelectronic devices; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on
Print_ISBN :
0-7503-0242-9
Type :
conf
DOI :
10.1109/SIM.1992.752699
Filename :
752699
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2652858
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