DocumentCode :
2652874
Title :
Scanning birefringence mapping of semi-insulating GaAs wafers
Author :
Clayton, R.D. ; Bassignana, I.C. ; Macquistan, D.A. ; Miner, C.J.
Author_Institution :
Bell Northern Research, Advanced Technology Lab, Canada
fYear :
1992
fDate :
21-24 Apr 1992
Firstpage :
211
Lastpage :
216
Keywords :
Anisotropic magnetoresistance; Birefringence; Capacitive sensors; Crystalline materials; Fluctuations; Gallium arsenide; Geometrical optics; Optical polarization; Photoluminescence; Surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on
Print_ISBN :
0-7503-0242-9
Type :
conf
DOI :
10.1109/SIM.1992.752701
Filename :
752701
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2652874
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