Title :
Characterization and modelling of gate current injection in embedded non-volatile flash memory
Author :
Zaka, Alban ; Garetto, Davide ; Rideau, Denis ; Palestri, Pierpaolo ; Manceau, Jean-Philippe ; Dornel, Erwan ; Rafhay, Quentin ; Clerc, Raphael ; Leblebici, Yusuf ; Tavernier, Clement ; Jaouen, Herve
Author_Institution :
STMicroelectronics, Crolles, France
Abstract :
Hot Carrier Injection (HCI) is investigated from the experimental and modelling perspectives. Extensive characterization of HCI is performed on flash devices to overcome the difficulties arising from direct gate injection measurements. Furthermore, a semi-analytical approach has been developped, capable of modelling both flash cell´s electrostatics during transient operation and gate current under HCI by a non-local model valid for long and short channel devices.
Keywords :
electrostatics; flash memories; hot carriers; direct gate injection measurements; electrostatics; embedded nonvolatile flash memory; flash devices; gate current injection; hot carrier injection; short channel devices; Current measurement; Human computer interaction; Logic gates; Mathematical model; Programming; Transient analysis; Voltage measurement;
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4244-8526-0
Electronic_ISBN :
1071-9032
DOI :
10.1109/ICMTS.2011.5976874
