Characterization and modelling of gate current injection in embedded non-volatile flash memory

Author

Zaka, Alban ; Garetto, Davide ; Rideau, Denis ; Palestri, Pierpaolo ; Manceau, Jean-Philippe ; Dornel, Erwan ; Rafhay, Quentin ; Clerc, Raphael ; Leblebici, Yusuf ; Tavernier, Clement ; Jaouen, Herve

Author_Institution

STMicroelectronics, Crolles, France

fYear

2011

fDate

4-7 April 2011

Firstpage

130

Lastpage

135

Abstract

Hot Carrier Injection (HCI) is investigated from the experimental and modelling perspectives. Extensive characterization of HCI is performed on flash devices to overcome the difficulties arising from direct gate injection measurements. Furthermore, a semi-analytical approach has been developped, capable of modelling both flash cell´s electrostatics during transient operation and gate current under HCI by a non-local model valid for long and short channel devices.

Keywords

electrostatics; flash memories; hot carriers; direct gate injection measurements; electrostatics; embedded nonvolatile flash memory; flash devices; gate current injection; hot carrier injection; short channel devices; Current measurement; Human computer interaction; Logic gates; Mathematical model; Programming; Transient analysis; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on

Conference_Location

Amsterdam

ISSN

1071-9032

Print_ISBN

978-1-4244-8526-0

Electronic_ISBN

1071-9032

Type

conf

DOI

10.1109/ICMTS.2011.5976874

Filename

5976874