DocumentCode
2653113
Title
Analysis of the steady and transient characteristics of the leakage current in GaAs integrated circuits
Author
Gual, J. ; Samitier, J. ; Morante, J.R.
Author_Institution
Universitat de Barcelona, Spain
fYear
1992
fDate
21-24 Apr 1992
Firstpage
319
Lastpage
324
Keywords
Analytical models; Context modeling; Electrodes; Gallium arsenide; III-V semiconductor materials; Impact ionization; Integrated circuit modeling; Leakage current; Threshold voltage; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on
Print_ISBN
0-7503-0242-9
Type
conf
DOI
10.1109/SIM.1992.752718
Filename
752718
Link To Document