• DocumentCode
    2653239
  • Title

    Ultra high-resolution FDTD modeling of a high-performance VLSI package

  • Author

    Ruiz, Cesar Mendez ; Simpson, Jamesina J. ; Horine, Bryce ; Slattery, Kevin

  • Author_Institution
    ECE Dept., Univ. of New Mexico, Albuquerque, NM, USA
  • fYear
    2009
  • fDate
    1-5 June 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Integrated circuits are ever-increasing in complexity while also shrinking in size. Further, ultra mobile devices are ever-increasing in functionality while also becoming more compact in size. The goal of this work is to support these trends by computationally studying electromagnetic compatibility issues both on a device level, as well as on individual component level, since these issues are beginning to dominate the design process of ultra mobile devices. Specifically, as a first step, we are employing an ultra high-resolution full-vector 3-D finite-difference time-domain (FDTD) model having 343 million grid cells to simulate sample ICs. We are using this model to study undesirable induced resonances, coupling, and other electromagnetic phenomena within ICs. In subsequent work, we will be adding additional components to yield an ultra high-resolution 3-D FDTD model of a complete compact portable electronic device.
  • Keywords
    VLSI; finite difference time-domain analysis; integrated circuit packaging; mobile handsets; 3D finite-difference time-domain model; compact portable electronic device; device level; electromagnetic compatibility issues; high-performance VLSI package; individual component level; integrated Circuits; ultra high-resolution FDTD modeling; ultra mobile devices; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic modeling; Finite difference methods; Integrated circuit packaging; Mobile computing; Process design; Resonance; Time domain analysis; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
  • Conference_Location
    Charleston, SC
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-3647-7
  • Type

    conf

  • DOI
    10.1109/APS.2009.5172054
  • Filename
    5172054