• DocumentCode
    2653359
  • Title

    Test requirements model (TeRM) overview and status

  • Author

    Shombert, Lee ; Bukata, Eric

  • Author_Institution
    Averstar Inc., Vienna, VA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    380
  • Lastpage
    387
  • Abstract
    Test requirements are a specification for a test program. Currently, most methods for capturing test requirements do not support machine processing. Test requirements, therefore, tend to add little value to the engineering process for tasks such as test development. The result is a reduced incentive to use, or even generate, test requirements. Even when generated, test requirements are often difficult to maintain as a current specification, with the test program often evolving as the primary documentation source for the requirements. The Test Requirements Model (TeRM) overcomes many of the impediments to test requirement capture and use by providing a consistent approach for representing the test requirements of a product. TeRM accomplishes this through an easily-processed format built on a rigorously-defined semantic model of test requirements. This paper traces the evolution of TeRM and provides its current status. Among the topics covered are changes resulting in a more usable grammar and a more streamlined information model. In addition, a summary of current and potential future applications for TeRM are presented. Finally, issues concerning the standardization of TeRM are addressed
  • Keywords
    automatic testing; design for testability; production testing; standardisation; system documentation; TeRM; Test Requirements Model; cost reduction; intellectual property; project management; standardization; streamlined information model; Documentation; Engineering management; Impedance; Maintenance engineering; Natural languages; Programming; Software development management; Software testing; Springs; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2000 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5868-6
  • Type

    conf

  • DOI
    10.1109/AUTEST.2000.885617
  • Filename
    885617