DocumentCode :
2653367
Title :
IEEE 1232 and P1522 standards
Author :
Sheppard, John ; Kaufman, Mark
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
fYear :
2000
fDate :
2000
Firstpage :
388
Lastpage :
397
Abstract :
The 1232 family of standards were developed to provide standard exchange formats and software services for reasoning systems used in system test and diagnosis. The exchange formats and services am based on a model of information required to support test and diagnosis. The standards were developed by the Diagnostic and Maintenance Control (D&MC) subcommittee of IEEE SCC20. The current efforts by the D&MC are a combined standard made up of the 1232 family, and a standard on Testability and Diagnosability Metrics, P1522. The 1232 standards describe a neutral exchange format so one diagnostic reasoner can exchange model information with another diagnostic reasoner. In addition, software interfaces are defined whereby diagnostic tools can be developed to process the diagnostic information in a consistent and reliable way. The objective of the Testability and Diagnosability Metrics standard is to provide notionally correct and mathematically precise definitions of testability measures that may be used to either measure the testability characteristics of a system, or predict the testability of a system. The end purpose is to provide an unambiguous source for definitions of common and uncommon testability and diagnosability terms such that each individual encountering it can know precisely what that term means. This paper describes the 1232 and P1522 standards and details the recent changes in the Information models, restructured higher order services and simplified conformance requirements
Keywords :
IEEE standards; automatic test software; diagnostic expert systems; diagnostic reasoning; fault diagnosis; software standards; IEEE 1232 standards; IEEE SCC20 subcommittee; Information models; P1522 standards; conformance; diagnosability; diagnosis; reasoning systems; software interfaces; standard exchange formats; standard software; system test; testability characteristics; Computer aided manufacturing; Databases; Design automation; Measurement standards; Software standards; Software tools; Standards development; Standards organizations; Standards publication; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1080-7725
Print_ISBN :
0-7803-5868-6
Type :
conf
DOI :
10.1109/AUTEST.2000.885619
Filename :
885619
Link To Document :
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