DocumentCode
2653433
Title
The state of interchangeability in ATE
Author
Fertitta, Kirk ; Eriksson, Daniel
Author_Institution
Pacific Software Group, San Diego, CA, USA
fYear
2000
fDate
2000
Firstpage
417
Lastpage
424
Abstract
The Interchangeable Virtual Instrument (IVI) Foundation formed in August of 1998 to address the challenge of instrument interchangeability in the test and measurement industry. Since its inception, the NI Foundation has engaged in vigorous standardization activities along several different though coherent, axes. Instrument class specifications are continuously under development for some of the most pervasive types of instruments. Architectural standards establishing IVI conformance criteria will broaden the capability of vendors, end-users, and system integrators to innovate while simultaneously allowing them to integrate into a heterogeneous IVI-based system. IVI Measurement Stimulus Subsystems (NI-MSS) standards under development offer the promise of a higher level of interchangeability than instrument-centric standards can offer. Shared NI infrastructure components will ensure interoperability in IVI systems by providing a common model for services such as configuration, installation, resource sharing, event notification and management and component instantiation. In addition, the Foundation has embraced COM technology as a powerful means for delivering interchangeable ATE software services
Keywords
automatic test equipment; automatic test software; open systems; research initiatives; standardisation; virtual instrumentation; COM technology; IVI conformance criteria; Interchangeable Virtual Instrument; NI Foundation; instrument interchangeability; interchangeable ATE software; management; resource sharing; shared NI infrastructure; standardization; standards; Computer industry; Instruments; Kirk field collapse effect; Measurement standards; Resource management; Software measurement; Software testing; Specification languages; Standardization; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location
Anaheim, CA
ISSN
1080-7725
Print_ISBN
0-7803-5868-6
Type
conf
DOI
10.1109/AUTEST.2000.885622
Filename
885622
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