DocumentCode :
2653476
Title :
Implementing AI-ESTATE in a component based architecture, Phase-II
Author :
Giarla, Amanda Jane ; Simerly, William L.
Author_Institution :
Hamilton Software Inc., Santa Rosa, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
438
Lastpage :
450
Abstract :
This paper discusses Phase-II of an Air Force funded SBIR R&D project concerned with implementing the IEEE 1232 Standard known as AI-ESTATE in a component based Automatic Test System (ATS). The intent of our Phase-II work is to provide the Air Force with a “working tool” that demonstrates the utility of our architectural approach as well as the utility of AI-ESTATE. The intent of our component based approach to ATS design is to provide a de-coupling of the diagnostic reasoner from the rest of the ATS as well as provide for a true open system at a reduced procurement and maintenance costs. AI-ESTATE is used to provide a standardized interface between the reasoner and the other ATS elements as well as provide standardized information and data model formats. The architecture consists of a COTS Test System (VXI package with LabVIEW), four “domain” type components: Diagnostic Engine Component (DEC), Application Executive Component (AEC), Test System Component (TSC) and Model Editing Component (MEC) that plug into our “Interoperable, Connectivity Enabling Framework” (ICEF) based on COM/DCOM. The four components and framework are discussed in general terms. The DEC implements AI-ESTATE and is further discussed in derail as are the other components. Also discussed are operational uses, diagnostic development, vendor competition and benefits
Keywords :
automatic test equipment; automatic test software; computer architecture; military computing; AEC; AI-ESTATE; ATS design; Air Force; Application Executive Component; Automatic Test System; COTS Test System; DEC; Diagnostic Engine Component; IEEE 1232 Standard; LabVIEW; MEC; Model Editing Component; SBIR R&D project; TSC; Test System Component; VXI package; architecture; component based architecture; decoupling; diagnostic reasoner; phase-II; standardized interface; Automatic testing; Computer architecture; Costs; Data models; Open systems; Plugs; Procurement; Research and development; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1080-7725
Print_ISBN :
0-7803-5868-6
Type :
conf
DOI :
10.1109/AUTEST.2000.885625
Filename :
885625
Link To Document :
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