Title :
A new bridging fault model for more accurate fault behavior
Author :
Emmert, John M. ; Stroud, Charles E. ; Bailey, James R.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
We describe a new bridging fault model which more accurately simulates the behavior of bridging faults that have been observed as a result of manufacturing fabrication defects in tightly packed logic structures
Keywords :
VLSI; fault simulation; integrated circuit testing; logic testing; production testing; CMOS; VLSI; bridging fault model; fault behavior; logic structures; manufacturing fabrication defects; Circuit faults; Computational modeling; Computer aided manufacturing; Fabrication; Logic; Manufacturing processes; Semiconductor device modeling; Testing; Very large scale integration; Virtual manufacturing;
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-5868-6
DOI :
10.1109/AUTEST.2000.885628
