• DocumentCode
    2653522
  • Title

    A new bridging fault model for more accurate fault behavior

  • Author

    Emmert, John M. ; Stroud, Charles E. ; Bailey, James R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    481
  • Lastpage
    485
  • Abstract
    We describe a new bridging fault model which more accurately simulates the behavior of bridging faults that have been observed as a result of manufacturing fabrication defects in tightly packed logic structures
  • Keywords
    VLSI; fault simulation; integrated circuit testing; logic testing; production testing; CMOS; VLSI; bridging fault model; fault behavior; logic structures; manufacturing fabrication defects; Circuit faults; Computational modeling; Computer aided manufacturing; Fabrication; Logic; Manufacturing processes; Semiconductor device modeling; Testing; Very large scale integration; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2000 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5868-6
  • Type

    conf

  • DOI
    10.1109/AUTEST.2000.885628
  • Filename
    885628
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2653522