DocumentCode
2653599
Title
On the errors arising in surface integral equations due to the discretization of the identity operator
Author
Ergul, Özgür ; Gürel, Levent
Author_Institution
Dept. of Electr. & Electron. Eng., Bilkent Univ., Ankara, Turkey
fYear
2009
fDate
1-5 June 2009
Firstpage
1
Lastpage
4
Abstract
Surface integral equations (SIEs) are commonly used to formulate scattering and radiation problems involving three-dimensional metallic and homogeneous dielectric objects with arbitrary shapes. For numerical solutions, equivalent electric and/or magnetic currents defined on surfaces are discretized and expanded in a series of basis functions. Then, the boundary conditions are tested on surfaces via a set of testing functions. Solutions of the resulting dense matrix equations provide the expansion coefficients of the equivalent currents, which can be used to compute the scattered or radiated electromagnetic fields. This study consists of two parts. In the first part, the authors show that the identity operator is truly a major error source in normal and mixed formulations that are discretized with low-order functions, e.g., Rao-Wilton-Glisson (RWG) functions. In the second part, the authors investigate the incompatibility of SIE formulations in the context of iterative solutions. The authors show that a compatibility test can be used to determine the breakpoint, where the accuracy of the solution is saturated and cannot be enhanced any more.
Keywords
electromagnetic wave propagation; electromagnetic wave scattering; integral equations; iterative methods; matrix algebra; 3D metallic object; homogeneous dielectric object; identity operator; iterative solutions; matrix equations; radiation problem; scattering problem; surface integral equations; Boundary conditions; Dielectrics; Electromagnetic fields; Electromagnetic radiation; Electromagnetic scattering; Integral equations; Saturation magnetization; Shape; Testing; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
Conference_Location
Charleston, SC
ISSN
1522-3965
Print_ISBN
978-1-4244-3647-7
Type
conf
DOI
10.1109/APS.2009.5172076
Filename
5172076
Link To Document