Trapped ion source

In this paper it is shown the design and the mechanical construction of a trapped ion source (TIS). TIS is a new type of source capable, in principle, of producing very highly charged ions and, at the same time, it is a radiofrequency quadrupole linear trap suitable to study the interaction of trapped ions (or charged microparticles) with electrons, high energy particles or laser beams. In practice, it is a modified version of an electron beam ion trap (EBIT) recently developed in some laboratories mainly to study X and UV spectroscopy for “hydrogenic” and “helium-like” ions. Among the goal of TIS, other than the production of highly charged particles, can be foreseen the production and trapping of radioactive isotopes, ion cooling, analysis of macromolecules and also “dust targets” for high energy accelerators