DocumentCode
2653665
Title
VXI synchro/resolver measurement and simulation COTS hardware for Turkish Airforce F-16 depot program ATE
Author
Johnson, Michael W.
Author_Institution
NAI Inc., Bohemia, NY, USA
fYear
2000
fDate
2000
Firstpage
534
Lastpage
538
Abstract
This paper describes the WesTest Engineering Corp. automatic test equipment (ATE) system, and the NAI, Inc VXI commercial-off-the-shelf (COTS) synchro/resolver resource card, used in the Turkish Airforce F-16 Depot Maintenance Program. The WesTest ATE system incorporates an open architecture VXIbus-based design and provides a general-purpose test capability for analog, digital, and hybrid assemblies, sub-assemblies and circuit cards. The ATE system is expandable and reconfigurable, end it is built to commercial specifications. All of the instruments in the tester are commercial-off-the-shelf (COTS) units, including the NAI Model 5390 synchro/resolver resource. NAI´s model 5390 is a C size precision Synchro/Resolver Simulation and Angle Position Measurement VXI COTS tester card. It can simulate and measure synchro and resolver angles with a resolution of 0.001 degrees and an accuracy of +/- 0.004 degrees. Interfacing to rugged reliable synchros, the 5390 functionality is based upon highly accurate synchro-to-digital conversion and digital-to-synchro simulation
Keywords
aerospace simulation; aircraft maintenance; aircraft testing; automatic test equipment; open systems; peripheral interfaces; F-16 aircraft; NAI; Turkish Airforce; VXI synchro/resolver measurement; VXIbus-based design; WesTest Engineering Corporation; commercial specifications; depot program ATE; digital-to-synchro simulation; general-purpose test capability; open architecture; simulation COTS hardware; synchro-to-digital simulation; Assembly systems; Automatic test equipment; Circuit simulation; Circuit testing; Control systems; Hardware; Instruments; Power supplies; Signal generators; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location
Anaheim, CA
ISSN
1080-7725
Print_ISBN
0-7803-5868-6
Type
conf
DOI
10.1109/AUTEST.2000.885636
Filename
885636
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