• DocumentCode
    2653665
  • Title

    VXI synchro/resolver measurement and simulation COTS hardware for Turkish Airforce F-16 depot program ATE

  • Author

    Johnson, Michael W.

  • Author_Institution
    NAI Inc., Bohemia, NY, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    534
  • Lastpage
    538
  • Abstract
    This paper describes the WesTest Engineering Corp. automatic test equipment (ATE) system, and the NAI, Inc VXI commercial-off-the-shelf (COTS) synchro/resolver resource card, used in the Turkish Airforce F-16 Depot Maintenance Program. The WesTest ATE system incorporates an open architecture VXIbus-based design and provides a general-purpose test capability for analog, digital, and hybrid assemblies, sub-assemblies and circuit cards. The ATE system is expandable and reconfigurable, end it is built to commercial specifications. All of the instruments in the tester are commercial-off-the-shelf (COTS) units, including the NAI Model 5390 synchro/resolver resource. NAI´s model 5390 is a C size precision Synchro/Resolver Simulation and Angle Position Measurement VXI COTS tester card. It can simulate and measure synchro and resolver angles with a resolution of 0.001 degrees and an accuracy of +/- 0.004 degrees. Interfacing to rugged reliable synchros, the 5390 functionality is based upon highly accurate synchro-to-digital conversion and digital-to-synchro simulation
  • Keywords
    aerospace simulation; aircraft maintenance; aircraft testing; automatic test equipment; open systems; peripheral interfaces; F-16 aircraft; NAI; Turkish Airforce; VXI synchro/resolver measurement; VXIbus-based design; WesTest Engineering Corporation; commercial specifications; depot program ATE; digital-to-synchro simulation; general-purpose test capability; open architecture; simulation COTS hardware; synchro-to-digital simulation; Assembly systems; Automatic test equipment; Circuit simulation; Circuit testing; Control systems; Hardware; Instruments; Power supplies; Signal generators; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2000 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5868-6
  • Type

    conf

  • DOI
    10.1109/AUTEST.2000.885636
  • Filename
    885636