DocumentCode :
2653866
Title :
Bridging the gap [between low-cost general purpose electronic test equipment and high cost ATE]
Author :
Webb, Tim
Author_Institution :
DiagnoSYS Inc., Kissimmee, FL, USA
fYear :
2000
fDate :
2000
Firstpage :
614
Lastpage :
620
Abstract :
This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military
Keywords :
automatic test equipment; printed circuit testing; test equipment; ATE; automatic test equipment; circuit card repair; circuit card test; general purpose electronic test equipment; mid-range capabilities; test program sets; Automatic test equipment; Automatic testing; Circuit testing; Costs; Electronic equipment testing; Government; Life testing; Performance evaluation; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1080-7725
Print_ISBN :
0-7803-5868-6
Type :
conf
DOI :
10.1109/AUTEST.2000.885648
Filename :
885648
Link To Document :
بازگشت