Title :
Gigabit Logic Prospects of GaAs E-JFET Integrated Circuits
Author :
Zuleeg, R. ; Notthoff, J.K. ; Behle, A.F.
fDate :
April 30 1979-May 2 1979
Abstract :
Computer simulation and experimental results will be presented for a 1 mu m GaAs enhancement mode JFET. Logic performance of 250 ps propagation delay time with a power dissipation of 200 mu W/gate at a fan-out of 3 offers gigabit logic for LSI, i.e. delay-power product of 50 fJ. A planar integration will be described which utilizes selective ion implantation of n- and p- impurities for the channel and pn-junction gate formation in semi-insulating GaAs substrate material.
Keywords :
Computer simulation; Gallium arsenide; Impurities; Ion implantation; Large scale integration; Logic circuits; Logic gates; Power dissipation; Propagation delay; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1979 IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
DOI :
10.1109/MWSYM.1979.1124121