Characterization of on-chip antennas for millimeter-wave applications

Author

Payandehjoo, Kasra ; Abhari, Ramesh

Author_Institution

Dept. of ECE, McGill Univ., Montreal, QC, Canada

fYear

2009

fDate

1-5 June 2009

Firstpage

1

Lastpage

4

Abstract

A method for characterization of on-chip antennas operating at millimeter-wave frequencies is presented in this paper. The test antenna is a dipole excited by coplanar strips and fabricated in low cost CMOS process. The radiation pattern and gain of the antenna is measured using a probe station and a vector network analyzer thus benefiting from calibration techniques that de-embed the effects of probes and connecting cables. A test set up is designed to measure the antenna gain and pattern at various angles on the antenna plane. Radiation patterns measured at 55 and 60 GHz show good agreement with fullwave simulations.

Keywords

CMOS integrated circuits; antenna radiation patterns; coplanar waveguides; millimetre wave antennas; strip lines; coplanar strip; frequency 55 GHz; frequency 60 GHz; low cost CMOS process; millimeter-wave frequency; on-chip antenna; probe station; radiation pattern; vector network analyzer; Antenna measurements; Antenna radiation patterns; Costs; Dipole antennas; Frequency; Gain measurement; Millimeter wave measurements; Millimeter wave technology; Probes; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE

Conference_Location

Charleston, SC

ISSN

1522-3965

Print_ISBN

978-1-4244-3647-7

Type

conf

DOI

10.1109/APS.2009.5172095

Filename

5172095