DocumentCode
2654574
Title
Clocked storage elements robust to process variations
Author
Moon, Joosik ; Aktan, Mustafa ; Oklobdzija, Vojin G.
Author_Institution
Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2009
fDate
20-23 Oct. 2009
Firstpage
827
Lastpage
830
Abstract
In this work, different types of clocked storage elements are compared in terms of the impact of process variations on their performances. Transistor sizes are obtained from energy-efficient characteristics and used in the simulation to measure the delay variations caused by process variations. The structure of a clocked storage element affects its robustness to process variations.
Keywords
clocks; transistor circuits; clocked storage elements; delay variations; energy-efficient characteristics; process variations; transistor sizes; Clocks; Degradation; Design methodology; Design optimization; Helium; Microelectronics; Multicore processing; Random access memory; Robustness; Timing; Clocked storage elements; energy-delay tradeoff; energy-efficient characteristics; process variations;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location
Changsha, Hunan
Print_ISBN
978-1-4244-3868-6
Electronic_ISBN
978-1-4244-3870-9
Type
conf
DOI
10.1109/ASICON.2009.5351566
Filename
5351566
Link To Document