DocumentCode
2654725
Title
Evaluation on roadside safety degree based on grey theory
Author
Li, Changcheng ; Gao, Hailong ; Chen, Shengli ; Qi, Guocai
Author_Institution
Dept. of Traffic Eng., Resaerch Inst. of Highway, Beijing
fYear
2006
fDate
17-20 Sept. 2006
Firstpage
1633
Lastpage
1637
Abstract
The issue of roadside safety is significant in China, especially for mountainous rural two-lane highway. Now there are no systematic methods and effective tools to evaluate the roadside safety degree (RSD) in China. In order to help engineers to make an informed decision or take the most effective measures in highway roadside safety improvement program, the author attempt to put forwards a roadside safety degree evaluation method based on the theory of grey clustering. The method that author offered integrate four categories factors, namely, geometry alignment, traffic volume, history crashes and roadside features. More than ten variables are adopted in the evaluation model. This method can quantify roadside safety performance in terms of level of RSD degree. In this paper, RSD is divided into I, II, III and IV four levels. The higher the level is, the worse the roadside safety performance is. The author introduced this method into Highway Safety-Enhancement Project (HSEP) launched by Ministry of Communications in 2003. In practice, this method revealed favorable feasibility. Additionally, the author has developed an auxiliary computer program (Roadside Safety Degree Evaluation Program-RSDEP), because of the complicated calculating process of the method
Keywords
grey systems; pattern clustering; road safety; traffic engineering computing; Highway Safety-Enhancement Project; grey clustering; grey theory; highway roadside safety improvement program; roadside safety degree evaluation; Bridges; Computer crashes; Geographic Information Systems; Geometry; History; Performance analysis; Road safety; Road transportation; Statistics; Traffic control;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Transportation Systems Conference, 2006. ITSC '06. IEEE
Conference_Location
Toronto, Ont.
Print_ISBN
1-4244-0093-7
Electronic_ISBN
1-4244-0094-5
Type
conf
DOI
10.1109/ITSC.2006.1707458
Filename
1707458
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