DocumentCode
2654743
Title
An efficient verification and test scheme for media broadcasting demodulator
Author
Chen, Yun ; Shao, Nan ; Xiang, Bo ; Bao, Dan ; Pan, An ; Zeng, Xiaoyang
Author_Institution
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear
2009
fDate
20-23 Oct. 2009
Firstpage
800
Lastpage
804
Abstract
For the complex development process of media broadcasting demodulator chip, it is proposed that a low cost, high reliability verification and test scheme at system level in this paper. This scheme emphasizes the collaboration of algorithm simulation, RTL description, FPGA verification, ASIC realization and any other stages of chip development. All these stages constitute an organic, closely interconnected whole. And for the particularity of communication chip, this scheme can solve function verification and performance test, ensure the accuracy, completeness and reliability of the test and verification. Then both the development time and the cost of the product are significantly reduced. This verification and test scheme has been applied to the demodulation chip of the receiver of Chinese broadcasting standard DTMB system.
Keywords
application specific integrated circuits; circuit reliability; circuit testing; demodulators; field programmable gate arrays; ASIC realization; Chinese broadcasting standard DTMB system; FPGA verification; RTL description; algorithm simulation; application specific integrated circuits; communication chip; field programmable gate arrays; high reliability verification scheme; media broadcasting demodulator chip; test scheme; Analytical models; Application specific integrated circuits; Broadcasting; Chip scale packaging; Circuit testing; Collaboration; Costs; Demodulation; Field programmable gate arrays; System testing; Broadcasting; Low Cost; Reliability; Verification and Test Scheme;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location
Changsha, Hunan
Print_ISBN
978-1-4244-3868-6
Electronic_ISBN
978-1-4244-3870-9
Type
conf
DOI
10.1109/ASICON.2009.5351575
Filename
5351575
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