• DocumentCode
    2654743
  • Title

    An efficient verification and test scheme for media broadcasting demodulator

  • Author

    Chen, Yun ; Shao, Nan ; Xiang, Bo ; Bao, Dan ; Pan, An ; Zeng, Xiaoyang

  • Author_Institution
    Dept. of Microelectron., Fudan Univ., Shanghai, China
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    800
  • Lastpage
    804
  • Abstract
    For the complex development process of media broadcasting demodulator chip, it is proposed that a low cost, high reliability verification and test scheme at system level in this paper. This scheme emphasizes the collaboration of algorithm simulation, RTL description, FPGA verification, ASIC realization and any other stages of chip development. All these stages constitute an organic, closely interconnected whole. And for the particularity of communication chip, this scheme can solve function verification and performance test, ensure the accuracy, completeness and reliability of the test and verification. Then both the development time and the cost of the product are significantly reduced. This verification and test scheme has been applied to the demodulation chip of the receiver of Chinese broadcasting standard DTMB system.
  • Keywords
    application specific integrated circuits; circuit reliability; circuit testing; demodulators; field programmable gate arrays; ASIC realization; Chinese broadcasting standard DTMB system; FPGA verification; RTL description; algorithm simulation; application specific integrated circuits; communication chip; field programmable gate arrays; high reliability verification scheme; media broadcasting demodulator chip; test scheme; Analytical models; Application specific integrated circuits; Broadcasting; Chip scale packaging; Circuit testing; Collaboration; Costs; Demodulation; Field programmable gate arrays; System testing; Broadcasting; Low Cost; Reliability; Verification and Test Scheme;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351575
  • Filename
    5351575