DocumentCode :
2654743
Title :
An efficient verification and test scheme for media broadcasting demodulator
Author :
Chen, Yun ; Shao, Nan ; Xiang, Bo ; Bao, Dan ; Pan, An ; Zeng, Xiaoyang
Author_Institution :
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear :
2009
fDate :
20-23 Oct. 2009
Firstpage :
800
Lastpage :
804
Abstract :
For the complex development process of media broadcasting demodulator chip, it is proposed that a low cost, high reliability verification and test scheme at system level in this paper. This scheme emphasizes the collaboration of algorithm simulation, RTL description, FPGA verification, ASIC realization and any other stages of chip development. All these stages constitute an organic, closely interconnected whole. And for the particularity of communication chip, this scheme can solve function verification and performance test, ensure the accuracy, completeness and reliability of the test and verification. Then both the development time and the cost of the product are significantly reduced. This verification and test scheme has been applied to the demodulation chip of the receiver of Chinese broadcasting standard DTMB system.
Keywords :
application specific integrated circuits; circuit reliability; circuit testing; demodulators; field programmable gate arrays; ASIC realization; Chinese broadcasting standard DTMB system; FPGA verification; RTL description; algorithm simulation; application specific integrated circuits; communication chip; field programmable gate arrays; high reliability verification scheme; media broadcasting demodulator chip; test scheme; Analytical models; Application specific integrated circuits; Broadcasting; Chip scale packaging; Circuit testing; Collaboration; Costs; Demodulation; Field programmable gate arrays; System testing; Broadcasting; Low Cost; Reliability; Verification and Test Scheme;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
Type :
conf
DOI :
10.1109/ASICON.2009.5351575
Filename :
5351575
Link To Document :
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