DocumentCode :
2655646
Title :
Dead-time optimization of SiC devices for voltage source converter
Author :
Zheyu Zhang ; Wang, Fred ; Costinett, Daniel J. ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Haifeng Lu
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
fYear :
2015
fDate :
15-19 March 2015
Firstpage :
1145
Lastpage :
1152
Abstract :
Dead-time in the voltage source converter significantly affects the reliability, power quality and losses. For SiC devices, considering the high sensitivity of turn-off time to the operating conditions (> 5× difference between light load and full load), as well as large extra energy loss induced by reverse conduction during superfluous dead-time (~ 15% of the switching loss), traditional fixed dead-time setting becomes inappropriate. This paper introduces an approach to achieve optimum dead-time for SiC based voltage source converter. First, turn-off behaviors under various operating conditions are investigated, and the relation between optimal dead-times and load currents are established. Second, a practical method for adaptive dead-time regulation is proposed, which consists of a dead-time optimization model and two gate assist circuits to sense the voltage commutation time during turn-off transient. Via synthesizing the monitored switching condition together with the preset dead-time optimization model, the micro-controller is able to online adjust the dead-time. Finally, based on a buck converter with 1200-V SiC MOSFETs, the test results show that by means of the proposed method, the power loss decreases by 12% at full load and 18.2% at light load.
Keywords :
MOSFET; optimisation; power convertors; silicon compounds; MOSFET; SiC; adaptive dead-time regulation; buck converter; dead-time optimization model; dead-time setting; load currents; microcontroller; optimal dead-times; power quality; reliability; turn-off transient; voltage 1200 V; voltage commutation time; voltage source converter; Logic gates; Optimization; Power conversion; Silicon carbide; Switches; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
Conference_Location :
Charlotte, NC
Type :
conf
DOI :
10.1109/APEC.2015.7104492
Filename :
7104492
Link To Document :
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