• DocumentCode
    2655856
  • Title

    A novel 3D thermal impedance model for high power modules considering multi-layer thermal coupling and different heating/cooling conditions

  • Author

    Bahman, Amir Sajjad ; Ke Ma ; Blaabjerg, Frede

  • Author_Institution
    Dept. of Energy Technol., Aalborg Univ., Aalborg, Denmark
  • fYear
    2015
  • fDate
    15-19 March 2015
  • Firstpage
    1209
  • Lastpage
    1215
  • Abstract
    Thermal management of power electronic devices is essential for reliable performance especially at high power levels. One of the most important activities in the thermal management and reliability improvement is acquiring the temperature information in critical points of the power module. However accurate temperature estimation either vertically or horizontally inside the power devices is still hard to identify. This paper investigates the thermal behavior of high power module in various operating conditions by means of Finite Element Method (FEM). A novel 3D thermal impedance network considering the multi-layer thermal coupling among chips is proposed. The impacts to the thermal impedance by various cooling and heating conditions are also studied. It is concluded that the heating and cooling conditions will have influence on the junction to case thermal impedances and need to be carefully considered in the thermal modelling. The proposed 3D thermal impedance network and the extraction procedure are verified in a circuit simulator and shows to be much faster with the same accuracy compared to FEM simulation. This network can be used for life-time estimation of IGBT module considering the whole converter system and more realistic loading conditions of the device.
  • Keywords
    cooling; finite element analysis; heating; modules; power electronics; reliability; thermal management (packaging); 3D thermal impedance model; FEM simulation; IGBT module; circuit simulator; finite element method; heating-cooling conditions; high power levels; high power modules; life-time estimation; multilayer thermal coupling; power electronic devices; reliability improvement; temperature estimation; temperature information; thermal management; Cooling; Finite element analysis; Heat transfer; Heating; Impedance; Insulated gate bipolar transistors; Temperature measurement; Thermal impedance; finite element method; heating/cooling conditions; reliability; thermal coupling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
  • Conference_Location
    Charlotte, NC
  • Type

    conf

  • DOI
    10.1109/APEC.2015.7104501
  • Filename
    7104501