Title :
Interchangeable boolean functions and their effects on redundancy in logic circuits
Author :
Das, Debesh K. ; Chakrabort, Susanta ; Bhattacharya, Bhargab B.
Author_Institution :
Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
Abstract :
A new concept of interchangeability of boolean functions under stuck-at faults in logic circuits is introduced in this paper. Two boolean functions F1 and F2 are said to be interchangeable if there exist two irredundant combinational networks N 1 and N2 realizing F1 and F2 respectively, such that under some single/multiple stuck-at fault f1(f2) in N1(N2), the faulty network realizes F2(F1). It has been shown that an infinite family of such interchangeable pairs of functions exist, and they play an important role in determining several new types of redundancy in combinational and sequential circuits
Keywords :
Boolean functions; logic circuits; logic testing; combinational networks; faulty network; interchangeable boolean functions; logic circuits; redundancy; sequential circuits; stuck-at faults; Boolean functions; Circuit faults; Combinational circuits; Computer science; Electrical fault detection; Fault detection; Input variables; Logic circuits; Redundancy; Sequential circuits;
Conference_Titel :
Design Automation Conference 1998. Proceedings of the ASP-DAC '98. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
0-7803-4425-1
DOI :
10.1109/ASPDAC.1998.669527
