Title :
IOCIMU-an integrated off-chip IDDQ measurement unit
Author :
Svajda, M. ; Straka, B. ; Manhaeve, H.
Author_Institution :
Tech. Univ. Brno, Czech Republic
Abstract :
The implementation of an off-chip IDDQ monitor to support the test of complex ASICs is presented in this paper. The monitor can be incorporated into a standard automated test equipment (ATE). It is capable of driving a 2 μF capacitive load and can perform measurements of the IDDQ of a device under test (DUT) in the 0-1 mA range. According to measurements the monitor can operate at the test rates up to 30 kHz and offers a resolution better than 0.1 μA. The on-chip integrated bypass switch is capable of handling DUT transient currents up to several amps. The IOC1MU prototype was fabricated in the 2-μm Mietec BiCMOS technology and has an active chip area of 20 mm2
Keywords :
BiCMOS integrated circuits; application specific integrated circuits; automatic testing; electric current measurement; integrated circuit measurement; integrated circuit testing; 0 to 1 mA; 2 micron; 2 muF; 30 kHz; IDDQ measurement; IOCIMU; Mietec BiCMOS technology; active chip area; capacitive load; complex ASICs; device under test; integrated bypass switch; off-chip measurement; resolution; standard automated test equipment; test rates; transient currents; Measurement units;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655988
